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Aehr Test Systems is the leader in wafer level burn-in for silicon carbide (SiC), gallium nitride (GaN), optical photonics, and memory integrated circuits.
Aehr Test Systems provides test solutions for testing, burning-in, and semiconductor devices in wafer level, singulated die, and package part form, and installed systems worldwide.
Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic, optical and memory integrated circuits and has over 2,500 systems installed worldwide.
Aehr Test Systems is the leader in wafer level burn-in for silicon carbide (SiC), gallium nitride (GaN), optical photonics, and memory integrated circuits.
Aehr Test Systems provides complete solutions to contact wafers, singulated die, module panels, multi-die modules, system level products and full PCBs. We utilize in house technology to offer industry leading solutions for: Full Wafer Single Touchdown Contactors. WaferPak Contactors.
Capable of handling up to 4 amps per contact. Aehr Test Systems is the leader in wafer level burn-in for silicon carbide (SiC), gallium nitride (GaN), optical photonics, and memory integrated circuits.
Mar 25, 2024 · Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic, optical and memory integrated circuits and has over 2,500 systems installed worldwide.
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Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic, optical and memory integrated circuits and has over 2,500 systems installed worldwide.