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JEOL is the leading global supplier of electron microscopes, ion beam instruments, mass spectrometers and NMR spectrometers.
JEOL can offer a wide range of lineups from general purpose scanning electron microscopes (W-SEM) including a benchtop type that allows operations just to anyone without specific knowledge and techniques, to high-end models of field emission scanning electron microscopes (FE-SEM).
Full-Scale Scanning Electron Microscopes (SEM) – from Macro to Nano. From our most powerful flagship Field Emission SEM with the ultimate resolution, magnification, and analytical flexibility, to our easy-to-use entry level Benchtop SEM, JEOL offers a wide choice of SEMs to suit all applications. JEOL introduced its first Scanning Electron ...
JEOL, with its origin in developing electron microscopes, has provided a wide variety of instruments using electron beam, ion beam, and X-ray techologies including transmission electron microscopes (TEM) and scanning electron microscopes (SEM).
High-energy resolution soft X-ray spectrometer for use with an electron microscope. A Synchrotron on your Desk? Seeing everything with an electron microscope. Institute of Multidisciplinary Research for Advanced Materials (IMRAM),
JEOL is a world leader in the development and manufacture of leading edge, high performance, high stability Transmission Electron Microscopes (TEM). JEOL introduced its first TEM over 70 years ago and has been developing and producing TEMs designed for life sciences and material sciences ever since.
High-sensitivity, low-noise 19 M pixel CMOS sensor enables clearer imaging with fine specimen details observable even at low electron doses. Its global shutter and high frame rate (58 fps/full pixel mode) enable image series acquisitions with less artifacts during dynamic observation.
