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Inspect metallurgical samples, materials science samples & more with UNITRON microscopes. We offer a wide range of inverted and upright metallurgical microscopes. Find yours today
Designed to Meet the most Advanced Needs of Microscopes. Request a Brochure. Motorized filter wheels & shutters for microscopy application
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JEOL is the leading global supplier of electron microscopes, ion beam instruments, mass spectrometers and NMR spectrometers.
- Mass Spectrometers
60 YEARS OF MASS SPECTROMETRY INNOVATION: JEOL Introduces...
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At JEOL USA, you can search the Applications, Categories,...
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To help our customers achieve their goals, we apply the same...
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JEOL is a world leader in electron optical equipment and...
- TEM
JEOL is a world leader in the development and manufacture of...
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Full-Scale Scanning Electron Microscopes (SEM) – from Macro...
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Electron Spin Resonance JES-X330; JES-X320; JES-X310; Mass...
- Cryomicroscopy
Transmission Electron Microscopes (TEM) of 120kV...
- F2: Multi-purpose Electron Microscope
This new generation of multi-purpose electron microscope is...
- Mass Spectrometers
JEOL can offer a wide range of lineups from general purpose scanning electron microscopes (W-SEM) including a benchtop type that allows operations just to anyone without specific knowledge and techniques, to high-end models of field emission scanning electron microscopes (FE-SEM).
JEOL, with its origin in developing electron microscopes, has provided a wide variety of instruments using electron beam, ion beam, and X-ray techologies including transmission electron microscopes (TEM) and scanning electron microscopes (SEM).
High-energy resolution soft X-ray spectrometer for use with an electron microscope. A Synchrotron on your Desk? Seeing everything with an electron microscope. Institute of Multidisciplinary Research for Advanced Materials (IMRAM),
High-sensitivity, low-noise 19 M pixel CMOS sensor enables clearer imaging with fine specimen details observable even at low electron doses. Its global shutter and high frame rate (58 fps/full pixel mode) enable image series acquisitions with less artifacts during dynamic observation.
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