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JEOL can offer a wide range of lineups from general purpose scanning electron microscopes (W-SEM) including a benchtop type that allows operations just to anyone without specific knowledge and techniques, to high-end models of field emission scanning electron microscopes (FE-SEM).
JEOL is the leading global supplier of electron microscopes, ion beam instruments, mass spectrometers and NMR spectrometers. Imaging and Analysis Solutions and Workflows
Products. Transmission Electron Microscope (TEM) High resolution obsrvation and structural anlaysis of the atomic level, elemental analysis of micro to nano area are possible. Transmission Electron Microscope (TEM) Scanning Electron Microscope (SEM) Mainly, observation of surface structure and elemental analysis can be performed.
Full-Scale Scanning Electron Microscopes (SEM) – from Macro to Nano From our most powerful flagship Field Emission SEM with the ultimate resolution, magnification, and analytical flexibility, to our easy-to-use entry level Benchtop SEM, JEOL offers a wide choice of SEMs to suit all applications.
Super High Precision Imaging, High Spatial and Energy Resolution Spectroscopy and In situ Electron Microscopy for Materials for Tomorrow and a Sustainable Future Chalmers University of Technology Development secret
JEOL USA Transmission Electron Microscopes. JEOL is a world leader in the development and manufacture of leading edge, high performance, high stability Transmission Electron Microscopes (TEM).
JEOL continues to be a leading company and supplies the latest TEM to the front line of research activities as a leading company. This page introduces 120kV TEMs suitable for soft materials, 200/300kV TEMs ranging from general-purpose to high-end models, cryo TEMs and semiconductor TEMs, which are becoming more important in recent years, and ...
