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With 50 issued patents and more in the pipeline, Aehr Test Systems is a recognized innovator and leader in the Burn-in and Semiconductor Test industry. Our patent portfolio includes novel inventions in the areas of: WaferPak temperature control methods; Vacuum & pressure-based WaferPaks; Maintaining probe contact over temp
Learn more about System Level Test and Burn-in Solutions. Aehr Test Systems is the leader in wafer level burn-in for silicon carbide (SiC), gallium nitride (GaN), optical photonics, and memory integrated circuits.
CONTACT US. Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic, optical and memory integrated circuits and has over 2,500 systems installed worldwide.
Facilitates High-Volume Full Wafer Production Testing and Burn-in with a Single Touchdown Approach. Carrier Designed for Easy Field Repairability. Aehr Test Systems is the leader in wafer level burn-in for silicon carbide (SiC), gallium nitride (GaN), optical photonics, and memory integrated circuits.
Aehr Test Systems provides test solutions for testing, burning-in, and semiconductor devices in wafer level, singulated die, and package part form, and installed systems worldwide.
Aehr Test Systems | 1,654 followers on LinkedIn. Worldwide leader in test and burn-in systems for Silicon Carbide, Logic, Memory, and Photonic devices. | Aehr Test Systems is a...
Oct 6, 2022 · Aehr Test Systems Reports 89% Revenue Growth Year over Year in First Quarter of Fiscal 2023 on Strength of Wafer Level Test and Burn-in of Silicon Carbide Devices used in Electric Vehicles. Aehr ...
